The "French SNOM User Meeting" is an annual event launched in 2022 with two main objectives: to build the fledgling French community of SNOM (scanning near-field optical microscope) users and to share the expertise and techniques developed by each participant. As the community’s expertise has grown, we can now add another objective to this event: to promote the potential of SNOM to new scientific communities.

This fourth edition of the "French SNOM User Meeting" aims to increase the number of participants interested in using SNOM for their research and will place special emphasis on opportunities to initiate new scientific collaborations.

Ce workshop a bénéficié d'une aide de l'État au titre de France 2030 (PhOM -Graduate School Physique) portant la référence ANR-11-IDEX-0003

The conference will take place over two days, November 23–24, 2026, in the Soleil Synchrotron auditorium.

The program will consist of 30-minute presentations in english (20 minutes for the presentation + 10 minutes for questions) and poster sessions designed to facilitate networking and the development of new research projects.

On November 25, 2026, tours of the SNOM facilities at Paris-Saclay and test measrement of samples :

• The ONDA platform at ONERA/DOTA Palaiseau and the SMIS line at the Soleil synchrotron will open their doors to visitors, offering a chance to explore two facilities that are unique in France: a synchrotron-beam SNOM and a cryogenic SNOM.
• The SMIS line offer some measurement slots for test samples. (Submission of proposal in parallele to the abstracts).

Attendance at the conference as a participant or speaker is free of charge.

Registration is required and will remain open until October 31, 2026.

With regard to the sample test on the soleil s-SNOM microscope, a proposal has to be sumitted on the submit page of this website).

Please note: Visits to ONERA’s SNOM and cryo-SNOM facilities are free of charge upon registration and require submission of a copy of your ID to gain access to the site.

 The main topics of this conference are studies using or for the SNOM:

* Across all spectral bands (visible, infrared, THz),

* On all types of materials (polymers, dielectrics, crystals, rocks, 2D materials, metamaterials...),

* In combination with other techniques (KPFM, AFM-IR, TERS, local photocurrent, cryogenics, etc.)

We also invite anyone interested in using microscope s-SNOM for their research to submit abstracts for the poster session.